More than Just a Grade: Formative Assessment with MapleTA and AiM

Author(s): 
Friedhelm Schwarz and Sibylle Weck-Schwarz
Publication_details: 
JEM Seminar on New and Emerging Technologies, Helsinki
Tipo: 
Slide presentation
Date: 
2007/08/18
AnexoTamanho
Helsinki2007Toledo.ppt104.5 KB