More than Just a Grade: Formative Assessment with MapleTA and AiM

Publication_details: 
JEM Seminar on New and Emerging Technologies, Helsinki
Author(s): 
Friedhelm Schwarz and Sibylle Weck-Schwarz
Type: 
Slide presentation
Datum: 
2007/08/18
BijlageGrootte
Helsinki2007Toledo.ppt104.5 KB

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